In situ photoelectron spectroscopic characterization of reactively sputtered, doped vanadium oxide thin films
Krammer, A., Gremaud, A., Bouvard, O., Sanjines, R., Schüler, A.Volume:
48
Langue:
english
Journal:
Surface and Interface Analysis
DOI:
10.1002/sia.5989
Date:
July, 2016
Fichier:
PDF, 207 KB
english, 2016