SPIE Proceedings [SPIE San Diego '92 - San Diego, CA (Sunday 19 July 1992)] Soft X-Ray Microscopy - Atomic force microscopy employed as the final imaging stage for soft x-ray contact microscopy
Cotton, Robin A., Dooley, Mike D., Fletcher, Julian H., Stead, Anthony D., Ford, Thomas W., Jacobsen, Chris J., Trebes, James E.Volume:
1741
Année:
1993
Langue:
english
DOI:
10.1117/12.138733
Fichier:
PDF, 1.45 MB
english, 1993