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SPIE Proceedings [SPIE Sixth International Conference on Thin Film Physics and Applications - Shanghai, China (Tuesday 25 September 2007)] Sixth International Conference on Thin Film Physics and Applications - Study of the defects in GaN epitaxial films grown on sapphire by HVPE
Liu, Zhanhui, Xiu, Xiangqian, Chen, Lin, Zhang, Rong, Xie, Zili, Han, Ping, Shi, Yi, Gu, Shulin, Zheng, YoudouVolume:
6984
Année:
2007
Langue:
english
DOI:
10.1117/12.792015
Fichier:
PDF, 2.73 MB
english, 2007