SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - San Diego, CA (Sunday 19 July 1998)] Scattering and Surface Roughness II - Analysis of microstructure changes and dynamic processes on rough surfaces using speckle correlation
Fricke-Begemann, Thomas, Beyrau, Frank, Guelker, Gerd, Hinsch, Klaus D., Jauschke, Peter, Wolff, Karin, Gu, Zu-Han, Maradudin, Alexei A.Volume:
3426
Année:
1998
Langue:
english
DOI:
10.1117/12.328445
Fichier:
PDF, 1.07 MB
english, 1998