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SPIE Proceedings [SPIE Microtechnologies for the New Millennium - Maspalomas, Gran Canaria, Spain (Wednesday 2 May 2007)] VLSI Circuits and Systems III - Test measures evaluation for VCO and charge pump blocks in RF PLLs
Asquini, Anna, de Armas Sosa, Valentín, Eshraghian, Kamran, Carbonero, Jean-Louis, Mir, Salvador, Tobajas, Félix B.Volume:
6590
Année:
2007
Langue:
english
DOI:
10.1117/12.721819
Fichier:
PDF, 254 KB
english, 2007