SPIE Proceedings [SPIE 2nd international Symposium on Advanced Optical Manufacturing and Testing Technologies - Xian, China (Wednesday 2 November 2005)] 2nd International Symposium on Advanced Optical Manufacturing and Testing Technologies: Advanced Optical Manufacturing Technologies - Study on cooling control of APD in the single-photon detection system
Zhou, Jinyun, Yang, Li, Wen, Shangming, Pei, Wen-yan, Wang, Wei-jiang, Chen, Yaolong, Kley, Ernst-Bernhard, Liao, Chang-jun, Liu, Song-haoVolume:
6149
Année:
2005
Langue:
english
DOI:
10.1117/12.674196
Fichier:
PDF, 276 KB
english, 2005