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SPIE Proceedings [SPIE Integrated Optoelectronic Devices 2004 - San Jose, CA, United States (Monday 26 January 2004)] Vertical-Cavity Surface-Emitting Lasers VIII - Reliability of 980-nm laser diodes based on Novalux extended-cavity surface-emitting laser (NECSEL) concept
Doan, Vincent V., Lei, Chun, Choquette, Kent D., Carey, Glen P., Zhou, Hailong, Kilcoyne, Sean P., Mooradian, Aram, Jenks, Ian, Lewis, Alan, Lear, Kevin L.Volume:
5364
Année:
2004
Langue:
english
DOI:
10.1117/12.529497
Fichier:
PDF, 496 KB
english, 2004