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SPIE Proceedings [SPIE SPIE Proceedings - (Sunday 12 February 2012)] - Observing diamond defects with an analytical color-fluorescence electron microscope
Nishimura, Kazuhito, Nakano, Tohru, Koike, Hirotami, Tomimori, Hiroshi, Kawarada, Hiroshi, Hiraki, Akio, Ogawa, Kazuo, Feldman, Albert, Holly, SandorAnnée:
2012
Langue:
english
DOI:
10.1117/12.22472
Fichier:
PDF, 1.17 MB
english, 2012