Estimating the reliability of an exposure variable in the presence of confounders
Mimi Y. Kim, Bernard S. Pasternack, Raymond J. Carroll, Karen L. Koenig, Paolo G. TonioloVolume:
14
Année:
1995
Langue:
english
Pages:
10
DOI:
10.1002/sim.4780141304
Fichier:
PDF, 675 KB
english, 1995