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Ultra-low-angle microtomy to back up S-SIMS molecular depth profiling with C60+ and Bin+ for the nanoscale analysis of high-tech industrial materials
R. De Mondt, Y. Vercammen, R. Dardenne, F. Vangaever, J. Van Luppen, L. Van VaeckVolume:
43
Année:
2011
Langue:
english
Pages:
4
DOI:
10.1002/sia.3593
Fichier:
PDF, 324 KB
english, 2011