XANES, USXES and XPS investigations of electron energy and atomic structure peculiarities of the silicon suboxide thin film surface layers containing Si nanocrystals
V. A. Terekhov, S. Yu. Turishchev, K. N. Pankov, I. E. Zanin, E. P. Domashevskaya, D. I. Tetelbaum, A. N. Mikhailov, A. I. Belov, D. E. Nikolichev, S. Yu. ZubkovVolume:
42
Année:
2010
Langue:
english
Pages:
6
DOI:
10.1002/sia.3338
Fichier:
PDF, 473 KB
english, 2010