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Coupling evanescent-wave fluorescence imaging and spectroscopy with scanning probe microscopy: challenges and insights from TIRF–AFM
James E. Shaw, John Oreopoulos, Daniel Wong, Jenny C. Y. Hsu, Christopher M. YipVolume:
38
Année:
2006
Langue:
english
Pages:
13
DOI:
10.1002/sia.2444
Fichier:
PDF, 945 KB
english, 2006