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Multivariate characterization of ultra-thin nanofunctional plasma polymer films using ToF-SIMS analysis
M. von Gradowski, M. Wahl, R. Förch, H. HilgersVolume:
36
Année:
2004
Langue:
english
Pages:
5
DOI:
10.1002/sia.1853
Fichier:
PDF, 127 KB
english, 2004