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SPIE Proceedings [SPIE Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies - Constanta, Romania (Thursday 26 August 2010)] Advanced Topics in Optoelectronics, Microelectronics, and Nanotechnologies V - Using fractal analysis of thermal signatures for thyroid disease evaluation
Gavriloaia, Gheorghe, Schiopu, Paul, Caruntu, George, Sofron, Emil, Gavriloaia, Mariuca-Roxana, Ghemigean, Adina-MarianaVolume:
7821
Année:
2010
Langue:
english
DOI:
10.1117/12.882294
Fichier:
PDF, 254 KB
english, 2010