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SPIE Proceedings [SPIE International Conference on Image Processing and Pattern Recognition in Industrial Engineering - Xi'an, China (Saturday 7 August 2010)] International Conference on Image Processing and Pattern Recognition in Industrial Engineering - An algorithm of multi-structure based on Riemannian manifold learning
Wang, Wei, Du, Zhengyu, Liu, Bin, Bi, Du-yan, Xiong, LeiVolume:
7820
Année:
2010
Langue:
english
DOI:
10.1117/12.866982
Fichier:
PDF, 531 KB
english, 2010