SPIE Proceedings [SPIE Photonics West '97 - San Jose, CA (Saturday 8 February 1997)] Micromachining and Imaging - Atomic force microscopy using small cantilevers
Walters, Deron A., Viani, Mario, Paloczi, George T., Schaeffer, Tilman E., Cleveland, Jason P., Wendman, Mark A., Gurley, Gus, Elings, Virgil B., Hansma, Paul K., Michalske, Terry A., Wendman, Mark A.Volume:
3009
Année:
1997
Langue:
english
DOI:
10.1117/12.271227
Fichier:
PDF, 315 KB
english, 1997
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