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SPIE Proceedings [SPIE SPIE's 1992 Symposium on Process Control and Monitoring - Somerset, NJ (Sunday 22 March 1992)] Optically Based Methods for Process Analysis - Problem solving in pharmaceutical production using scanning infrared microprobe analysis
Reffner, John A., Bomse, David S., Brittain, Harry, Farquharson, Stuart, Lerner, Jeremy M., Rein, Alan J., Sohl, Cary, Todd, Terry R., Weyer, LoisVolume:
1681
Année:
1992
Langue:
english
DOI:
10.1117/12.137753
Fichier:
PDF, 510 KB
english, 1992