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Enhanced surface sensitivity in secondary ion mass spectrometric analysis of organic thin films using size-selected Ar gas-cluster ion projectiles
Motohiro Tanaka, Kousuke Moritani, Tomokazu Hirota, Noriaki Toyoda, Isao Yamada, Norio Inui, Kozo MochijiVolume:
24
Année:
2010
Langue:
english
Pages:
6
DOI:
10.1002/rcm.4529
Fichier:
PDF, 260 KB
english, 2010