SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 12 August 2012)] X-Ray Free-Electron Lasers: Beam Diagnostics, Beamline Instrumentation, and Applications - Resonant soft x-ray scattering endstation for time-resolved pump-probe measurements at LCLS
Chuang, Yi-De, Doering, Dionisio, Cruz, Alejandro G., Tahir, Nadeem, Andresen, Nord C., Chow, Ken P., Contarato, Devis, Cummings, Curtis L., Domning, Edward E., Joseph, John, Pepper, John S., Smith, BVolume:
8504
Année:
2012
Langue:
english
DOI:
10.1117/12.931492
Fichier:
PDF, 1.13 MB
english, 2012
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