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SPIE Proceedings [SPIE International Symposium on Microelectronics and Assembly - Singapore, Singapore (Monday 27 November 2000)] Design, Modeling, and Simulation in Microelectronics - Surface-potential-based model of reverse short-channel effect in submicrometer MOSFETs with nonuniform lateral channel doping
Qian, Wensheng, Zhou, Xing, Wang, Yuwen, Lim, Khee Y., Courtois, Bernard, Demidenko, Serge N., Lau, Lee Y.Volume:
4228
Année:
2000
Langue:
english
DOI:
10.1117/12.405420
Fichier:
PDF, 167 KB
english, 2000