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SPIE Proceedings [SPIE International Symposium on Optical Science and Technology - San Diego, CA (Sunday 30 July 2000)] Optical Devices and Diagnostics in Materials Science - Facility for the curvature-based measurement of the nanotopography of complex surfaces
Thomsen-Schmidt, Peter, Schulz, Michael, Weingaertner, Ingolf, Andrews, David L., Asakura, Toshimitsu, Jutamulia, Suganda, Kirk, Wiley P., Lagally, Max G., Lal, Ravindra B., Trolinger, James D.Volume:
4098
Année:
2000
Langue:
english
DOI:
10.1117/12.401615
Fichier:
PDF, 1.09 MB
english, 2000