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SPIE Proceedings [SPIE ICO20:Optical Devices and Instruments - Changchun, China (Sunday 21 August 2005)] ICO20: Optical Devices and Instruments - Measurement of the birefringence distribution in high resolution laser scanning lenses
Cho, Hee Sung, Wyant, James C., Zhang, Xuejun, Lee, Yun Woo, Lee, Jae Hyeob, Hwangbo, Chang Kwon, Lee, Jon UngVolume:
6024
Année:
2005
Langue:
english
DOI:
10.1117/12.666846
Fichier:
PDF, 603 KB
english, 2005