SPIE Proceedings [SPIE Optical Science and Technology, the SPIE 49th Annual Meeting - Denver, CO (Monday 2 August 2004)] Interferometry XII: Applications - Development of standard measurement chain for full-field optical strain measurement methods
Salbut, Leszek, Kujawinska, Malgorzata, Patterson, Eann, Hack, Erwin, Burguete, Richard, Whelan, Maurice P., Mendels, David A., Osten, Wolfgang, Novak, ErikVolume:
5532
Année:
2004
Langue:
english
DOI:
10.1117/12.560939
Fichier:
PDF, 1.12 MB
english, 2004
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