SPIE Proceedings [SPIE Fifth International Symposium on Instrumentation and Control Technology - Beijing, China (Friday 24 October 2003)] Fifth International Symposium on Instrumentation and Control Technology - Research development of the gray error theory and applications in dynamic measurement
Wang, Zhongyu, Xia, Xintao, Zhu, Jianmin, Qin, Ping, Zhang, Guangjun, Zhao, Huijie, Wang, ZhongyuVolume:
5253
Année:
2003
Langue:
english
DOI:
10.1117/12.521687
Fichier:
PDF, 114 KB
english, 2003