
SPIE Proceedings [SPIE Photonics Technologies for Robotics, Automation, and Manufacturing - Providence, RI (Monday 27 October 2003)] Two- and Three-Dimensional Vision Systems for Inspection, Control, and Metrology - 2D packing using the Myriad framework
Chatburn, Luke T., Batchelor, Bruce G., Batchelor, Bruce G., Hugli, HeinzVolume:
5265
Année:
2004
Langue:
english
DOI:
10.1117/12.517467
Fichier:
PDF, 400 KB
english, 2004