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SPIE Proceedings [SPIE Optical Tools for Manufacturing and Advanced Automation - Boston, MA (Tuesday 7 September 1993)] Intelligent Robots and Computer Vision XII: Algorithms and Techniques - Finding landmark features under a broad range of lighting conditions
Fennema, Jr., Claude L., Casasent, David P.Volume:
2055
Année:
1993
Langue:
english
DOI:
10.1117/12.150135
Fichier:
PDF, 648 KB
english, 1993