SPIE Proceedings [SPIE SPIE Optical Metrology - Munich, Germany (Monday 23 May 2011)] Optical Measurement Systems for Industrial Inspection VII - Remote laboratory for digital holographic metrology
Wilke, Marc, Lehmann, Peter H., Osten, Wolfgang, Alekseenko, Igor, Situ, Guohai, Gastinger, Kay, Sarker, Konica, Riedel, Margarita, Pedrini, Giancarlo, Osten, WolfgangVolume:
8082
Année:
2011
Langue:
english
DOI:
10.1117/12.892073
Fichier:
PDF, 1.89 MB
english, 2011
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