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SPIE Proceedings [SPIE Integrated Optoelectronics Devices - San Jose, CA (Saturday 25 January 2003)] Vertical-Cavity Surface-Emitting Lasers VII - Characterization of failure mechanisms for oxide VCSELs
McHugo, Scott A., Krishnan, A., Krueger, Joachim J., Luo, Yong, Tan, Ningxia, Osentowski, Tim, Xie, Suning, Mayonte, Myrna S., Herrick, Robert W., Deng, Qing, Heidecker, Mike, Eastley, David, Keever,Volume:
4994
Année:
2003
Langue:
english
DOI:
10.1117/12.482637
Fichier:
PDF, 355 KB
english, 2003