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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, United States (Sunday 25 August 2013)] Optics for EUV, X-Ray, and Gamma-Ray Astronomy VI - Aberration-free silicon pore x-ray optics
Collon, Maximilien J., Ackermann, Marcelo, Günther, Ramses, Vacanti, Giuseppe, Beijersbergen, Marco W., Bavdaz, Marcos, Wille, Eric, Wallace, Kotska, Haneveld, Jeroen, Olde Riekerink, Mark, Koelewijn,Volume:
8861
Année:
2013
Langue:
english
DOI:
10.1117/12.2024982
Fichier:
PDF, 867 KB
english, 2013