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SPIE Proceedings [SPIE SPIE's 1994 International Symposium on Optics, Imaging, and Instrumentation - San Diego, CA (Sunday 24 July 1994)] NASA/SPIE Conference on Spin-Off Technologies from NASA for Commercial Sensors and Scientific Applications - Measurement of surface topography by remote sensing
Kunz, Terry D., Di Rosa, Don, Hill, John M., Stetina, Fran, Friedman, Donald S., Minnifield, Nona K.Volume:
2270
Année:
1994
Langue:
english
DOI:
10.1117/12.188818
Fichier:
PDF, 1.86 MB
english, 1994