SPIE Proceedings [SPIE Electronic Imaging 2005 - San Jose, CA (Monday 17 January 2005)] Image Processing: Algorithms and Systems IV - Sampling the parameter domain of image series
Heizmann, Michael, Dougherty, Edward R., Astola, Jaakko T., Beyerer, Juergen, Egiazarian, Karen O.Volume:
5672
Année:
2005
Langue:
english
DOI:
10.1117/12.586750
Fichier:
PDF, 661 KB
english, 2005