SPIE Proceedings [SPIE Photonics Asia 2002 - Shanghai, China (Monday 14 October 2002)] Advanced Materials and Devices for Sensing and Imaging - Design of a high accuracy temperature-controlling thermal radiation source for thermographic inspection
Shen, XueJu, Wang, Yuefeng, Zhang, Chu, Wang, Fu, Dong, Wei, Yao, Jianquan, Ishii, YukihiroVolume:
4919
Année:
2002
Langue:
english
DOI:
10.1117/12.471900
Fichier:
PDF, 62 KB
english, 2002