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[IEEE 2014 International Conference on Reliability, Maintainability and Safety (ICRMS) - Guangzhou, China (2014.8.6-2014.8.8)] 2014 10th International Conference on Reliability, Maintainability and Safety (ICRMS) - Location techniques of failure analysis ESD damage in electronic component
Lai, Ping, Wang, Youliang, Liang, Xiaosi, Kuang, Xianjun, Zou, JinlinAnnée:
2014
Langue:
english
DOI:
10.1109/icrms.2014.7107152
Fichier:
PDF, 1.05 MB
english, 2014