Low temperature (down to 450 °C) annealed TiAl contacts on N-type gallium nitride characterized by differential scanning calorimetry
Nicolas Thierry-Jebali, Olivier Menard, Rodica Chiriac, Emmanuel Collard, Christian Brylinski, Frédéric Cayrel, Daniel AlquierVolume:
8
Année:
2011
Langue:
english
Pages:
3
DOI:
10.1002/pssc.201000597
Fichier:
PDF, 228 KB
english, 2011