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SPIE Proceedings [SPIE Photonics East '99 - Boston, MA (Sunday 19 September 1999)] Scientific Detection of Fakery in Art II - Authentication at a small museum: the kindness of strangers
Hyland, Douglas K. S., Chartier, Duane R., McCrone, Walter, Weiss, Richard J.Volume:
3851
Année:
2000
Langue:
english
DOI:
10.1117/12.379874
Fichier:
PDF, 739 KB
english, 2000