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SPIE Proceedings [SPIE SPIE's International Symposium on Optical Science, Engineering, and Instrumentation - Denver, CO (Sunday 18 July 1999)] Subsurface Sensors and Applications - Microwave sensors for nondestructive testing of materials
Lasri, Tuami, Glay, David, Mamouni, Ahmed, Leroy, Yves, Nguyen, CamVolume:
3752
Année:
1999
Langue:
english
DOI:
10.1117/12.365711
Fichier:
PDF, 370 KB
english, 1999