SPIE Proceedings [SPIE IS&T/SPIE's Symposium on Electronic Imaging: Science & Technology - San Jose, CA (Sunday 5 February 1995)] Visual Data Exploration and Analysis II - Particle tracing in curvilinear grids
Reed, David M., Wade, Lawson, Carswell, Peter G., Carlson, Wayne E., Grinstein, Georges G., Erbacher, Robert F.Volume:
2410
Année:
1995
Langue:
english
DOI:
10.1117/12.205943
Fichier:
PDF, 303 KB
english, 1995