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Characterization of InAs/AlSb tunneling double barrier heterostructure by ballistic electron emission microscope with InAs as base electrode
J. Vaniš, D. H. Chow, J. Pangrác, F. Šroubek, T. C. McGill, J. WalachováAnnée:
2003
Langue:
english
Pages:
6
DOI:
10.1002/pssc.200306238
Fichier:
PDF, 200 KB
english, 2003