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SPIE Proceedings [SPIE OE/LASE '90, 14-19 Jan., Los Angeles, CA - Los Angeles, CA (Sunday 14 January 1990)] Laser Diode Technology and Applications II - Reliability characteristics of high-power laser diodes
Welch, David F., Kung, Hsing H., Sakamoto, Masamichi, Zucker, Erik P., Streifer, William S., Scifres, Donald R., Botez, Dan, Figueroa, LuisVolume:
1219
Année:
1990
Langue:
english
DOI:
10.1117/12.18246
Fichier:
PDF, 139 KB
english, 1990