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SPIE Proceedings [SPIE Measurement Technology and Intelligent Instruments - Wuhan, China (Friday 29 October 1993)] Measurement Technology and Intelligent Instruments - High-precision voltage measurement based on the Josephson junction array voltage standard
Gao, Jie, Zhang, Chao-Jun, Zhong, Guo-Lin, Zhou, Yuqing, Zhang, Qi-Zhao, Zhu, LiVolume:
2101
Année:
1993
Langue:
english
DOI:
10.1117/12.156510
Fichier:
PDF, 580 KB
english, 1993