SPIE Proceedings [SPIE 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies - Dalian, China (Monday 26 April 2010)] 5th International Symposium on Advanced Optical Manufacturing and Testing Technologies: Optoelectronic Materials and Devices for Detector, Imager, Display, and Energy Conversion Technology - Study on the cloud layer height and properties in Hefei observed by lidar
Chen, Zhenyi, Jiang, Ya-Dong, Kippelen, Bernard, Liu, Wenqing, Zhang, Yujun, Yu, Junsheng, He, Junfeng, Ruan, Jun, Li, Sheng, Cui, YibenVolume:
7658
Année:
2010
Langue:
english
DOI:
10.1117/12.865730
Fichier:
PDF, 176 KB
english, 2010
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