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SPIE Proceedings [SPIE SPIE's 27th Annual International Symposium on Microlithography - Santa Clara, CA (Sunday 3 March 2002)] Emerging Lithographic Technologies VI - Electron-beam lithography of isolated trenches with chemically amplified positive resist
Eckert, Andrew R., Bojko, Richard J., Gentile, Harold, Harris, Robert, Jayashankar, Jay, Johns, Earl, Minor, Kevin, Mountfield, Keith, Seiler, Carl, Yang, XiaoMin, Engelstad, Roxann L.Volume:
4688
Année:
2002
Langue:
english
DOI:
10.1117/12.472361
Fichier:
PDF, 1.05 MB
english, 2002