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SPIE Proceedings [SPIE ICO XVIII 18th Congress of the International Commission for Optics - San Francisco, CA (Monday 2 August 1999)] 18th Congress of the International Commission for Optics - Geometric phase coherence probe microscope for surface profiling
Roy, Maitreyee, Cherel, L., Sheppard, Colin J. R., Glass, Alexander J., Goodman, Joseph W., Chang, Milton, Guenther, Arthur H., Asakura, ToshimitsuVolume:
3749
Année:
1999
Langue:
english
DOI:
10.1117/12.354836
Fichier:
PDF, 147 KB
english, 1999