SPIE Proceedings [SPIE SPIE Optics + Optoelectronics - Prague, Czech Republic (Monday 15 April 2013)] Damage to VUV, EUV, and X-ray Optics IV; and EUV and X-ray Optics: Synergy between Laboratory and Space III - Multiple free electron laser pulse illumination of a carbon coated silicon substrate
Siemer, Björn, Hoger, Tim, Rutkowski, Marco, Menneken, Martina, Düsterer, Stefan, Zacharias, Helmut, Juha, Libor, Bajt, Saša, London, Richard, Hudec, René, Pina, LadislavVolume:
8777
Année:
2013
Langue:
english
DOI:
10.1117/12.2017248
Fichier:
PDF, 635 KB
english, 2013
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