Raman-scattering characterization of InN films grown by pressurized metal organic vapor phase epitaxy
Jung Gon Kim, Yasuhito Kamei, Atsuhito Kimura, Noriyuki Hasuike, Hiroshi Harima, Kenji Kisoda, Yu Huai Liu, Takashi MatsuokaVolume:
249
Année:
2012
Langue:
english
Pages:
5
DOI:
10.1002/pssb.201147452
Fichier:
PDF, 485 KB
english, 2012