Possibilities of X-Ray Interfernce Diffractometry for the Investigation of Ion-Doped Layers
V. V. Aristov, V. N. Mordkovich, A. Yu. Nikulin, A. A. Snigirev, U. Winter, Yu. N. Erokhin, P. ZaumseilVolume:
120
Année:
1990
Langue:
english
Pages:
1
DOI:
10.1002/pssa.2211200127
Fichier:
PDF, 233 KB
english, 1990