
The Influence of Stress on the Fine Structure of Schottky Diode I-U Characteristics in the Breakdown Region
R. V. Konakova, Yu. A. Tkhorik, I. L. Zaitsevskii, P. Kordos, M. Morvič, J. CervenakVolume:
77
Année:
1983
Langue:
english
Pages:
1
DOI:
10.1002/pssa.2210770258
Fichier:
PDF, 202 KB
english, 1983