Study of Imperfections in Ge–Te Semiconductors by the Positron Annihilation Technique
B. V. Kobrin, R. M. Kupriyanova, V. S. Minaev, E. P. Prokopiev, V. P. ShantarovichVolume:
73
Année:
1982
Langue:
english
Pages:
4
DOI:
10.1002/pssa.2210730204
Fichier:
PDF, 276 KB
english, 1982