[IEEE 2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Long Beach, CA, USA (2016.3.20-2016.3.24)] 2016 IEEE Applied Power Electronics Conference and Exposition (APEC) - Modular test system architecture for device, circuit and system level reliability testing
Sleik, Roland, Glavanovics, Michael, Einspieler, Sascha, Muetze, Annette, Krischan, KlausAnnée:
2016
Langue:
english
DOI:
10.1109/apec.2016.7467957
Fichier:
PDF, 2.27 MB
english, 2016