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Microstructure and Grain Orientation Evolution in Sn-3.0Ag-0.5Cu Solder Interconnects Under Electrical Current Stressing
Chen, Hongtao, Hang, Chunjin, Fu, Xing, Li, MingyuVolume:
44
Langue:
english
Journal:
Journal of Electronic Materials
DOI:
10.1007/s11664-015-3922-2
Date:
October, 2015
Fichier:
PDF, 2.56 MB
english, 2015